发明名称 APPARATUS FOR TRANSFERRING TRAY AND TEST HANDLER FOR ELECTRONIC COMPONENT
摘要 The present invention relates to an apparatus for transferring a tray and to a test handler for an electronic component. The apparatus for transferring a tray comprises: a first combining device having a first tray combined therewith to receive an electronic component; a first movement part for moving the first combining device so that the first tray can move while circulating between an exchange position, where a loading process of loading an electronic component and an unloading process of unloading an electronic component are conducted, and a test position, where an testing process of connecting an electronic component to a testing device and testing the electronic component is conducted; a second combining device having a second tray combined therewith to receive an electronic component; and a second movement part for moving the second combining device so that the second tray can move while circulating between the exchange position and the test position. The first movement part includes a first raising and lowering device for raising and lowering the first combining device so that the first combining device can move while circulating between the exchange position and the test position by evading the second combining device. The second movement part includes a second raising and lowering device for raising and lowering the second combining device so that the second combining device can move while circulating between the exchange position and the test position by evading the first combining device.
申请公布号 KR20150140889(A) 申请公布日期 2015.12.17
申请号 KR20140068810 申请日期 2014.06.07
申请人 MIRAE CORPORATION 发明人 PARK, HAE JUN;JANG, TAE HOON
分类号 G01R31/26 主分类号 G01R31/26
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