发明名称 METHOD FOR MEASURING RAISING/LOWERING PATHWAY AND INTERFERENCE DETERMINATION SYSTEM
摘要 In the present invention, a measurement apparatus (1) is attached to a guide rail (13) above a carriage (12). Next, the measurement apparatus (1) performs a measurement, obtaining first dimensional data including the dimensional data of the top of a raising/lowering pathway (8). The measurement apparatus (1) is removed from the guide rail (13), and the carriage (12) is moved upwards and then stopped. After the carriage (12) is stopped, the measurement apparatus (1) is attached to the guide rail (13) below the carriage (12). The measurement apparatus (1) performs a measurement, obtaining second dimensional data including the dimensional data of the bottom of the raising/lowering pathway (8). The obtained first dimensional data and second dimensional data are combined, generating dimensional data for the entirety of the raising/lowering pathway (8).
申请公布号 WO2015190173(A1) 申请公布日期 2015.12.17
申请号 WO2015JP61853 申请日期 2015.04.17
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 SAMBONGI, KEISUKE;TANAKA, RYOJI;ISHIGURO, SHINJI
分类号 B66B7/00;G01B21/02 主分类号 B66B7/00
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