发明名称 RELIABILITY MEASUREMENTS FOR PHASE BASED AUTOFOCUS
摘要 Techniques related to autofocus for imaging devices and, in particular, to generating reliability values associated with phase autofocus shifts are discussed. Such techniques may include performing a curve fitting based on accumulated phase difference values and phase shifts for phase autofocus images and generating a reliability value for a focus phase shift based on the curve fitting.
申请公布号 WO2015191163(A1) 申请公布日期 2015.12.17
申请号 WO2015US26517 申请日期 2015.04.17
申请人 INTEL CORPORATION 发明人 SAMUROV, VITALI;KRESTYANNIKOV, EVGENY;NIKKANEN, JARNO
分类号 H04N5/232;H04N5/225 主分类号 H04N5/232
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