发明名称 |
RELIABILITY MEASUREMENTS FOR PHASE BASED AUTOFOCUS |
摘要 |
Techniques related to autofocus for imaging devices and, in particular, to generating reliability values associated with phase autofocus shifts are discussed. Such techniques may include performing a curve fitting based on accumulated phase difference values and phase shifts for phase autofocus images and generating a reliability value for a focus phase shift based on the curve fitting. |
申请公布号 |
WO2015191163(A1) |
申请公布日期 |
2015.12.17 |
申请号 |
WO2015US26517 |
申请日期 |
2015.04.17 |
申请人 |
INTEL CORPORATION |
发明人 |
SAMUROV, VITALI;KRESTYANNIKOV, EVGENY;NIKKANEN, JARNO |
分类号 |
H04N5/232;H04N5/225 |
主分类号 |
H04N5/232 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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