发明名称 ETCHING APPARATUS USING INDUCTIVELY COUPLED PLASMA
摘要 An etching apparatus using inductively coupled plasma (ICP) includes a chuck, an antenna, and a dielectric window. The substrate is mounted on the chuck. The antenna is disposed on an upper part of the chuck and forms an induced electromagnetic field between the chuck and the antenna. The dielectric window is disposed between the antenna and the chuck and delivers the induced electromagnetic field to the substrate. The dielectric window has: at least two receiving spaces into which etching gases, generating plasma by the induced electromagnetic field, are introduced; and a plurality of spray holes connected to the receiving spaces individually and spraying the etching gases toward the substrate. Therefore, a flow rate of the etching gases supplied to the substrate can be selectively adjusted.
申请公布号 KR20150140936(A) 申请公布日期 2015.12.17
申请号 KR20140069155 申请日期 2014.06.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SUN, JONG WOO
分类号 H01L21/3065;H01L21/683 主分类号 H01L21/3065
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