发明名称 HIGH-VOLTAGE METAL-OXIDE SEMICONDUCTOR DEVICE AND CORRESPONDING MANUFACTURING METHOD AND IMPLANTATION MASK
摘要 <p>A method of fabricating high- voltage semiconductor devices wherein a region extending between a drain region and a source region and being a RESURF region (103) or a buried drain extension (102) has a portion of reduced doping concentration, the semiconductor devices and a mask for implanting dopants in a semiconductor are described.</p>
申请公布号 WO2008132703(A8) 申请公布日期 2009.01.08
申请号 WO2008IB51696 申请日期 2008.05.01
申请人 NXP B.V.;EGGENKAMP, PAULUS J. T.;BOOS, PRISCILLA W. M.;LUDIKHUIZE, ADRIANUS WILLEM;SWANENBERG, MAARTEN JACOBUS;VAN DALEN, ROB;HERINGA, ANCO 发明人 EGGENKAMP, PAULUS J. T.;BOOS, PRISCILLA W. M.;LUDIKHUIZE, ADRIANUS WILLEM;SWANENBERG, MAARTEN JACOBUS;VAN DALEN, ROB;HERINGA, ANCO
分类号 H01L29/78;H01L21/266;H01L21/336;H01L29/06;H01L29/08 主分类号 H01L29/78
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