| 摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device and an apparatus for manufacturing the semiconductor device where the surface of a copper film is etched precisely, in a short time with few steps, while the surface roughness of the copper film is not progressed in the etching process of the surface of the copper film that includes oxidation of the copper film and removing the oxide thereof, with an acid or alkali. SOLUTION: The method includes a step of filling a wiring groove or a contact hole, by stacking a wiring metal in the wiring groove or the contact hole formed on the insulation film on a semiconductor substrate, a step for exposing the insulating film by polishing the wiring metal, a step of cleaning the semiconductor substrate, and a step for recess etching the surface of the wiring metal embedded in the wiring groove or the contact hole. The main component of a chemical used in at least two steps, selected from among the polishing step, the cleaning step, and the recess etching step are the same. COPYRIGHT: (C)2009,JPO&INPIT
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