| 摘要 |
An electromagnetic field distribution measuring apparatus (10) comprises an electromagnetic field probe (20) for measuring an electromagnetic field distribution, a scanning device (30) for scanning the vicinity of a wire (120) with the electromagnetic field probe (20), and a data processing device (50) for calculating the offset value (?Xd) of the coordinate of the electromagnetic field probe (20) with respect to the coordinate of the wire (120). The data processing device (50) extracts feature points (E1 to E3) of the measured electromagnetic field distribution and calculates the offset value (?Xd), based on the coordinates of the extracted feature points (E1 to E3). |
