发明名称 Lithographic method and device manufactured thereby
摘要 A substrate processing method of a substrate provided with an anti-reflective coating which extends to or beyond a peripheral edge of the substrate is disclosed. The method includes removing a portion of the anti-reflective coating adjacent to and around a periphery of the substrate using a back-side removal process, depositing a layer of radiation sensitive material onto the anti-reflective coating, depositing a top-coat layer onto the layer of radiation sensitive material, and simultaneously removing a portion of the layer of radiation sensitive material and a portion of the top-coat layer from around an area adjacent to the periphery of the substrate using a top-side removal process.
申请公布号 US2009011369(A1) 申请公布日期 2009.01.08
申请号 US20070822429 申请日期 2007.07.05
申请人 ASML NETHERLANDS B.V. 发明人 WONG PATRICK;GEHOEL VAN ANSEM WENDY FRANSISCA JOHANNA;MAAS RUDOLF ADRIANUS JOANNES;WANG SUPING
分类号 G03C5/00 主分类号 G03C5/00
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