发明名称 |
METHOD OF PROBE ADAPTATION FOR CHEMICAL FORCE MICROSCOPY |
摘要 |
FIELD: measuring technology. ^ SUBSTANCE: invention refers to chemical force microscopy (CFM) and can be used for intensification of chemical contrast of the images formed by means of a nuclear force microscope ensured by physical and chemical adaptation of the probing needles. The method of probe adaptation for chemical force microscopy consists that a probe placed in a reactor, processed wit ha low-temperature plasma of inorganic (e.g. residual air, nitrogen) gases or organic (e.g. octane) gases. Said plasma is excited with a variable electromagnetic field of high-frequency range (10 MHz - 100 MHz) mainly or with direct current of variable polarity. Thus a uniform plasma-polymerised coating is formed over the whole surface of the probe. ^ EFFECT: development of the simple and effective method for adaptation of the chemical surface structure of needles of standard probes for nuclear force microscopy. ^ 8 cl, 19 dwg |
申请公布号 |
RU2381512(C2) |
申请公布日期 |
2010.02.10 |
申请号 |
RU20080106530 |
申请日期 |
2008.02.19 |
申请人 |
GOSUDARSTVENNOE UCHREZHDENIE FIZIKO-TEKHNICHESKIJINSTITUT URAL'SKOGO OTDELENIJA ROSSIJSKOJ AKADEMII NAUK FTI URO RAN |
发明人 |
BAJANKIN VLADIMIR JAKOVLEVICH;BYSTROV SERGEJ GENNAD'EVICH;ZHIKHAREV ALEKSANDR VLADIMIROVICH |
分类号 |
G01Q70/08;G01Q60/24;G01Q60/38 |
主分类号 |
G01Q70/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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