发明名称 |
METHOD OF COMPARATIVE ASSESSMENT RELIABILITY OF BATCHES OF SEMICONDUCTOR PRODUCTS |
摘要 |
FIELD: physics; semiconductors. ^ SUBSTANCE: invention relates to microelectronics and specifically to methods of ensuring quality and reliability of semiconductor devices and can be used for comparative assessment of reliability of batches of semiconductor devices at the manufacturing stage and incoming inspection at radio-electronic equipment manufacturing enterprises. Mechanical tests and exposure to electrostatic discharges are carried out at maximum permissible values under technical conditions, and reliability of batches of semiconductor devices compared by comparing minimum, medium and maximum values of the information-bearing parametre before and after tests. ^ EFFECT: improved values of information-bearing parametres and increased reliability. ^ 1 tbl |
申请公布号 |
RU2381514(C1) |
申请公布日期 |
2010.02.10 |
申请号 |
RU20080124486 |
申请日期 |
2008.06.16 |
申请人 |
GOSUDARSTVENNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA "VORONEZHSKIJ GOSUDARSTVENNYJ TEKHNICHESKIJ UNIVERSITET" |
发明人 |
GORLOV MITROFAN IVANOVICH;ZOLOTAREVA EKATERINA ALEKSANDROVNA;KOZ'JAKOV NIKOLAJ NIKOLAEVICH |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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