发明名称
摘要 <p>An apparatus for programming a threshold-voltage of a non-volatile memory cell includes a reference voltage generator means applying a predetermined voltage to a word line of a reference memory cell having the same electric characteristics as the memory cell desired to be programmed and generating a reference voltage by thusly generated current; a comparator means comparing the reference voltage with a bit line voltage according to the cell current flowing at the memory cell to be programmed; a word line voltage generator means being controlled by a level count value, selecting word line voltages corresponding to the plurality of threshold voltages of the memory cell to be programmed and outputting it; a word line driving means applying the word line voltages selected by the word line voltage generator means to the word line selected by the word line enable signal; a level data selector means encoding a state data and selectively outputting data corresponding to each level by the level select signal; a latch means being controlled by the output signal from the comparator, latching the data outputted from the level data selector means; a bit line voltage controller means selectively discontinuing programming according to the level of the data latched by the latch means; and a bit line selector means selecting a specific bit line by a bit line enable signal</p>
申请公布号 JP4411474(B2) 申请公布日期 2010.02.10
申请号 JP19990264383 申请日期 1999.09.17
申请人 发明人
分类号 G11C16/02;G11C16/06;G11C16/00;G11C16/12 主分类号 G11C16/02
代理机构 代理人
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