发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>PURPOSE: A semiconductor device and a method for manufacturing the same are provided to improve the electrical property of forming a gate insulation layer and a semiconductor film consecutively without the exposure to the air. CONSTITUTION: A gate insulation layer(102) is formed on a gate electrode layer(101). A semiconductor layer(103) is formed on the gate insulation layer. The first and second buffer layers(104a,104b) are formed on the semiconductor layer. A source electrode layer(105a) is formed on the first buffer layer. A drain electrode layer(105b) is formed on the second buffer layer. The first and the second buffer layer comprise a metal oxide, and a first and a second buffer layer have the n type conductivity.</p>
申请公布号 KR20100014164(A) 申请公布日期 2010.02.10
申请号 KR20090070385 申请日期 2009.07.31
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;MIYAIRI HIDEKAZU;AKIMOTO KENGO;SHIRAISHI KOJIRO
分类号 H01L29/786;G02F1/136 主分类号 H01L29/786
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