发明名称 ANALYSIS APPARATUS
摘要 An analysis apparatus includes an assignor assigning a physical property value corresponding to the kind of a material to each of regions formed by dividing a structural data representing a structure of a multilayer substrate, a determiner determining whether or not the each of the region belongs to a predetermined region in a layer of a predetermined kind, and a physical property value changer changing the physical property value of the region belonging to a predetermined region in a layer of a predetermined kind.
申请公布号 US2010023299(A1) 申请公布日期 2010.01.28
申请号 US20090505904 申请日期 2009.07.20
申请人 FUJITSU LIMITED 发明人 KUBOTA TETSUYUKI;ITOH NOBUTAKA
分类号 G01B11/24 主分类号 G01B11/24
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