发明名称 SURFACE TEXTURE MEASURING INSTRUMENT AND MEASURING METHOD
摘要 A surface texture measuring instrument includes: a measuring device that includes a detector for detecting surface texture of a workpiece and an X-axis movement mechanism for moving the detector in a measurement direction; an elevation inclination adjuster capable of adjusting an elevation position and an inclination angle of a table on which the measuring device is mounted; a stage on which the workpiece is mounted; and a controller that controls the measuring device and the elevation inclination adjuster. The controller includes: a measurement controller that controls the X-axis movement mechanism to conduct a preliminary measurement and main measurement of the workpiece; a computing unit that acquires a result of the preliminary measurement from the detector and obtains an inclination angle of the workpiece at which the workpiece is inclined to the measurement direction; and a positioning controller for adjusting the inclination angle of the table based on the obtained inclination angle.
申请公布号 US2010018298(A1) 申请公布日期 2010.01.28
申请号 US20090510401 申请日期 2009.07.28
申请人 MITUTOYO CORPORATION 发明人 KANEMATSU TOSHIHIRO;MISHIMA HIDEKI;HAMA NOBUYUKI
分类号 G01B21/30;G01B5/00;G01N19/00 主分类号 G01B21/30
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