发明名称 ABNORMAL AREA DETECTION APPARATUS AND ABNORMAL AREA DETECTION METHOD
摘要 An abnormal area detecting apparatus is provided for detecting the presence or absence and the position of abnormality with high accuracy using higher-order local auto-correlation feature. The abnormal area detecting apparatus comprises means for extracting feature data from image data on a pixel-by-pixel basis through higher-order local auto-correlation; means for adding the feature data extracted by the feature data extracting means for pixels within a predetermined range including each of pixels spaced apart by a predetermined distance; means for calculating an index indicative of abnormality of feature data with respect to a subspace indicative of a normal area; means for determining an abnormality based on the index; and means for outputting a pixel position at which an abnormal is determined. The apparatus may extract a plurality of higher-order local auto-correlation feature data which differ in displacement width. Further, the apparatus may comprise means for finding a subspace indicative of a normal area based on a principal component vector from feature data in accordance with a principal component analysis approach. The apparatus is capable of determine an abnormality on a pixel-by-pixel basis, and capable of correctly detecting the position of an abnormal area.
申请公布号 US2010021067(A1) 申请公布日期 2010.01.28
申请号 US20070304552 申请日期 2007.06.13
申请人 OTSU NOBUYUKI;NANRI TAKUYA 发明人 OTSU NOBUYUKI;NANRI TAKUYA
分类号 G06K9/46 主分类号 G06K9/46
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