PURPOSE: A measuring apparatus is provided to measure the electrical characteristic of the super conduction of superconductive small sized part. CONSTITUTION: The probe support(10) comprises the conductive left plate and the electrically insulated conductive right plate. The rotating unit(20) is connected to the probe supporting part. The rotational direction converter(30) rotates the rotational direction] of the rotating unit with 90 degree. The sample unit(50) is connected to the rotation direction transform part and performs the rotational movement.
申请公布号
KR20100008826(A)
申请公布日期
2010.01.27
申请号
KR20080069400
申请日期
2008.07.17
申请人
ANDONG NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION