发明名称 SUPPLY APPARATUS, SEMICONDUCTOR MANUFACTURING APPARATUS AND SEMICONDUCTOR MANUFACTURING METHOD
摘要 PURPOSE: A supply apparatus, a semiconductor manufacturing apparatus and a semiconductor manufacturing method are provided to form a uniform thickness of cap metal on a wafer by preventing affects of byproducts produced in plating. CONSTITUTION: A supply apparatus comprises nozzles(144a,144b,144c,154), a temperature controller, an insulation part, and a delivery mechanism. The nozzles have supply holes for discharging plating liquid to the target surface of a wafer. The temperature controller accepts plating liquid for processing a certain amount of wafers, and controls the temperature of the plating liquid. The insulation part keeps the temperature of the plating liquid. The delivery device transfers the temperature-controlled plating liquid to the supply holes of the nozzles after the insulation part.
申请公布号 KR20100009467(A) 申请公布日期 2010.01.27
申请号 KR20090022644 申请日期 2009.03.17
申请人 TOKYO ELECTRON LIMITED 发明人 TANAKA TAKASHI;SAITO YUSUKE;IWASHITA MITSUAKI
分类号 C25D17/00 主分类号 C25D17/00
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