首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD AND APPARATUS FOR MEASURING THIN FILM SAMPLE
摘要
申请公布号
EP1843126(B1)
申请公布日期
2009.12.09
申请号
EP20050820171
申请日期
2005.12.22
申请人
SII NANOTECHNOLOGY INC.
发明人
IKKU, YUTAKA;ASAHATA, TATSUYA;SUZUKI, HIDEKAZU
分类号
G01B15/02;G01N23/20;G01N23/225;H01J37/28;H01J37/30;H01L21/66
主分类号
G01B15/02
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Buried digit line stack and process for making same
Position sensor
Cosmetic compositions having improved tactile and wear properties
Magnet control system for battery powered living tissue stimulators
Semiconductor device and manufacturing method thereof
Process for preparing (cyclo)aliphatic isocyanates
Storage area network (SAN) device logical relationships manager
Connector with force isolating ejector system
Toy figure and a game comprising such toy figure
Bi-level digit line architecture for high density DRAMS
Methods of making bioprosthetic heart valves with strain matched leaflets
Packaged microelectronic devices with interconnecting units
Dynamically re-configurable CMOS imagers for an active vision system
Multi-band power amplifier
Stage-actuators that do not generate fluctuating magnetic fields, and stage devices comprising same
Electromagnetic wave transforming device
Electrohydraulic lifting control device for industrial trucks
High-capacity multimode optical fiber systems
Ultrasound information processing system and ultrasound information exchange protocol therefor
Process and apparatus for separating diluent from polymer solids
