发明名称 APPARATUS FOR TESTING LED, AND ITS METHOD
摘要 PURPOSE: An LED inspection apparatus and method thereof are provided to automatically inspect the superiority / fault of LED using visible light and ultraviolet ray. CONSTITUTION: An LED inspection apparatus comprises a first lighting part(200), a second lighting part(300), a color filter(500), an image taking part(600) and an LED state detector(700). The first lighting part generates a first light. The first lighting part supplies the first light to the LED coated with a mold compound having a preset colored phosphor. The second lighting part supplies a second light the LED. The color filter passes through the fixed light from the LED. The image taking part receives the light passing through the color filter and takes the image. The LED state detector decides the LED superiority / fault using the LED image from the image taking part.
申请公布号 KR20090126610(A) 申请公布日期 2009.12.09
申请号 KR20080052775 申请日期 2008.06.04
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 JI, WON SOO;LEE, WOOK HEE;SONG, HO YOUNG;CHO, CHONG WOOK;KIM, SUNG JAE;YUN, YOUNG SU;KIM, HONG MIN
分类号 G01B11/24;G01B11/00 主分类号 G01B11/24
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