发明名称 Insulated gate semiconductor device and method of manufacturing the same
摘要 <p>A semiconductor device in a semiconductor substrate (10) including a first region (12), a source region (20), a second region (14), a drain region (30), a gate insulating layer (60), a field insulating layer (50) and a gate electrode (40). The field insulating layer has, in its portion overlapping the gate electrode, such a step (51) that a portion of the field insulating layer between the step and the gate insulating layer is thinner than the rest of the field insulating layer.</p>
申请公布号 EP2131399(A2) 申请公布日期 2009.12.09
申请号 EP20090006857 申请日期 2009.05.20
申请人 NEC ELECTRONICS CORPORATION 发明人 MORI, TAKAHIRO
分类号 H01L29/78;H01L21/336;H01L21/8234;H01L27/088;H01L29/423 主分类号 H01L29/78
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