发明名称 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD
摘要 A positive resist composition comprises: (A) a compound that generates an acid upon irradiation with an actinic ray or radiation; and (B) a resin that has an acid-decomposable repeating unit represented by formula (I′), has a dispersity of 1.5 or less and increases its solubility in an alkali developer by action of an acid, wherein Xa1 represents a hydrogen atom, an alkyl group, a cyano group or a halogen atom; Ry1 to Ry3 each independently represents an alkyl group or a cycloalkyl group, and at least two members out of Ry1 to Ry3 may combine to form a ring structure; and Z represents a divalent linking group.
申请公布号 EP2130094(A1) 申请公布日期 2009.12.09
申请号 EP20080739645 申请日期 2008.03.26
申请人 FUJIFILM CORPORATION 发明人 KANEKA, YUSHI;KODAMA, KUNIHIKO;SHIBUYA, AKINORI;YOSHIDA, YUKO
分类号 G03F7/039 主分类号 G03F7/039
代理机构 代理人
主权项
地址
您可能感兴趣的专利