发明名称 ELECTRICAL IMPEDANCE TOMOGRAPHY METHOD AND DEVICE
摘要 <p>Electrical impedance tomography method comprising: an electrical measurement step during which pre-determined electrical conditions are imposed on the surface of a medium to be imaged, while generating a mechanical disturbance at predefined points of the medium by locally modifying the impedance of the medium and an electrical parameter is measured at several points on the surface of the medium; and a calculation step during which the electrical impedance is determined at several points in the internal volume of the medium, taking into account the measurements carried out during the disturbance, as a function of a law for modification of the electrical impedance by this disturbance.</p>
申请公布号 EP2069770(A2) 申请公布日期 2009.06.17
申请号 EP20070823866 申请日期 2007.09.26
申请人 CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE-CNRS 发明人 AMMARI, HABIB;BONNETIER, ERIC;CAPDEBOSCQ, YVES;TANTER, MICKAEL;FINK, MATHIAS
分类号 G01N27/02;A61B5/053 主分类号 G01N27/02
代理机构 代理人
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