发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having a SOI structure for reducing a resistance difference between a substrate and a metal layer. SOLUTION: The semiconductor device comprises the substrate (a lightly-doped substrate 11), an insulating layer (an oxide film 12) formed on the substrate, an active layer 13 formed on the insulating layer, and the metal layer (a metal thin film 15) formed on the backside of the substrate, the substrate and the metal layer having ohmic contact with each other. Since the substrate and the metal layer have ohmic contact with each other, a resistance difference between the substrate and the metal layer is reduced. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009087980(A) 申请公布日期 2009.04.23
申请号 JP20070251932 申请日期 2007.09.27
申请人 NEC ELECTRONICS CORP 发明人 TAKAO NORIYUKI
分类号 H01L29/786;H01L21/02;H01L21/76;H01L21/762;H01L27/12;H01L29/41 主分类号 H01L29/786
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