发明名称 PHOTOVOLTAIC FABRICATION PROCESS MONITORING AND CONTROL USING DIAGNOSTIC DEVICES
摘要 The formation of diagnostic devices on the same substrate used to fabricate a photovoltaic (PV) cell is described. Such devices, also referred to as process diagnostic vehicles (PDVs), are configured for in-line monitoring of electrical characteristics of PV cell features and are formed on the substrate using the same process steps for PV cell fabrication. The data collected via the PDVs can be used to tune or optimize subsequent PV cell fabrication, i.e., used as feedback for the fabrication process. Alternatively, the data collected via PDVs can be fed forward in the fabrication process, so that later process steps performed on a PV cell substrate can be modified to compensate for issues detected on the PV cell substrate via the PDVs.
申请公布号 US2009104342(A1) 申请公布日期 2009.04.23
申请号 US20080212594 申请日期 2008.09.17
申请人 APPLIED MATERIALS, INC. 发明人 WANG DAPENG;FREI MICHEL R.;SU TZAY-FA (JEFF);SVIDENKO VICKY;HIGASHI GREGG S.
分类号 B05D5/12;B05C9/12;G01R31/26 主分类号 B05D5/12
代理机构 代理人
主权项
地址
您可能感兴趣的专利