发明名称 FINFET STRUCTURE INCLUDING MULTIPLE SEMICONDUCTOR FIN CHANNEL HEIGHTS
摘要 A semiconductor structure and a method for fabricating the semiconductor structure include a first semiconductor fin and a second semiconductor fin of the same overall height over a substrate. Due to the presence of a channel stop layer at the base of one of the first semiconductor fin and the second semiconductor fin, but not the other of the first semiconductor fin and the second semiconductor fin, the first semiconductor fin and the second semiconductor fin have different channel heights. The semiconductor fins may be used to fabricating a corresponding first finFET and a corresponding second finFET with differing performance characteristics due to the different channel heights of the first semiconductor fin and the second semiconductor fin.
申请公布号 US2009057780(A1) 申请公布日期 2009.03.05
申请号 US20070845265 申请日期 2007.08.27
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 WONG ROBERT C.;YANG HAINING
分类号 H01L27/12;H01L21/336;H01L29/76 主分类号 H01L27/12
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