发明名称 METHOD FOR TESTING MEMORY
摘要 A method for testing a memory includes the following steps. First, data is read from the memory and stored to a first temporary memory. Meanwhile, expected data corresponding to the data from the memory is written into a second temporary memory from a tester. Thereafter, the data in the first temporary memory and the expected data in the second temporary memory are compared with each other to judge whether the memory has an enough operation window.
申请公布号 US2009059698(A1) 申请公布日期 2009.03.05
申请号 US20070850061 申请日期 2007.09.05
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 CHANG CHIN-HUNG;HO WEN-CHIAO;CHANG KUEN-LONG;HUNG CHUN-HSIUNG
分类号 G11C29/00 主分类号 G11C29/00
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