发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 To provide a thin film integrated circuit at low cost and with thin thickness, which is applicable to mass production unlike the conventional glass substrate or the single crystalline silicon substrate, and a structure and a process of a thin film integrated circuit device or an IC chip having the thin film integrated circuit. A manufacturing method of a semiconductor device includes the steps of forming a first insulating film over one surface of a silicon substrate, forming a layer having at least two thin film integrated circuits over the first insulating film, forming a resin layer so as to cover the layer having the thin film integrated circuit, forming a film so as to cover the resin layer, grinding a backside of one surface of the silicon substrate which is formed with the layer having the thin film integrated circuit, and polishing the ground surface of the silicon substrate.
申请公布号 US2009057680(A1) 申请公布日期 2009.03.05
申请号 US20080260107 申请日期 2008.10.29
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 KUSUMOTO NAOTO;TSURUME TAKUYA
分类号 H01L29/04;H01L29/786 主分类号 H01L29/04
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