发明名称 SAMPLE ANALYSIS SYSTEM
摘要 An apparatus for analyzing a sample, the apparatus comprising a first clamping chuck adapted for receiving a first portion of the sample, a second clamping chuck adapted for receiving a second portion of the sample, a drive unit adapted for applying a force to the first clamping chuck, and a measurement unit adapted for measuring at least one physical parameter indicative of a property of the sample received by the first clamping chuck and the second clamping chuck in response to the application of the force to the first clamping chuck, wherein the second clamping chuck is free of a separate drive unit.
申请公布号 WO2009027097(A2) 申请公布日期 2009.03.05
申请号 WO2008EP07094 申请日期 2008.08.29
申请人 MONTANUNIVERSITAET LEOBEN;FROESCHL, JUERGEN;EICHLSEDER, WILFRIED 发明人 FROESCHL, JUERGEN;EICHLSEDER, WILFRIED
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