| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which circuit area for data transmission test can be decreased. SOLUTION: The semiconductor integrated circuit for performing an input/output test of data is provided with a sense amplifier detecting a level of input data and a sense amplifier controller for blocking a signal path between the sense amplifier and a memory cell when a test mode signal is activated. COPYRIGHT: (C)2009,JPO&INPIT
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