发明名称 |
SEMICONDUCTOR MEMORY DEVICE |
摘要 |
A semiconductor memory device is provided to perform a high speed operation by performing a read/write operation of data according to a current sensing mode. In a unit cell(C), data is read/written by a high dielectric capacitor. A cell data sensing part(110) controls a current of a main bit line according to a sensing voltage of a sub bit line in a sensing operation of the data. A write control part(120) stores the data to a corresponding unit cell according to a current level supplied from the main bit line to sub bit line. A sensing amplifier compares and amplifies a data current and a reference current supplied from the main bit line. The write control part supplies a write voltage lower than a pumping voltage level and higher than a ground voltage level in writing the data to the main bit line.
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申请公布号 |
KR100887046(B1) |
申请公布日期 |
2009.03.04 |
申请号 |
KR20070088150 |
申请日期 |
2007.08.31 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KANG, HEE BOK;HONG, SUK KYOUNG |
分类号 |
G11C11/4074;G11C11/4091;G11C11/4094;G11C11/4097 |
主分类号 |
G11C11/4074 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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