发明名称 MEASURING DEVICE, CONTROL CIRCUIT, PROGRAM, AND MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a measuring device, a control circuit, a program and a measuring method for analyzing data when the measuring device does not store a large volume of data and when access concentration occurs on a memory of a device to be measured. SOLUTION: A measuring device for measuring a signal accessing the memory of the device to be measured comprises a first storage unit storing data; a data measuring unit measuring the sinal accessing the memory of the device to be measured; a second storage unit temporarily storing data to be measured by the measuring unit; a memory use rate calculation unit calculating a use rate of the memory of the device to be measured on the basis of the data to be measured by the measuring unit; and a data control unit storing the data stored in the second storage unit in the first storage unit when the memory use rate calculated by the calculation unit exceeds a prescribed threshold. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009020673(A) 申请公布日期 2009.01.29
申请号 JP20070182320 申请日期 2007.07.11
申请人 SHARP CORP 发明人 UENO TETSUO
分类号 G06F11/28;G06F11/30 主分类号 G06F11/28
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