发明名称 Method of Forming Wiring Patterns Using Nano-Ink Comprising Metals Having Low Melting Point
摘要 Disclosed is a method of forming a wiring pattern using nano-ink, including providing a mixture solution of at least one first metal selected from the group consisting of gold, silver, and copper and at least one second metal selected from the group consisting of lead, zinc, tin, indium, cadmium, gallium, and alloys thereof, having an average particle size ranging from 5 nm to 1 mum in a reducing atmosphere; forming a wiring pattern on a base layer using the mixture solution; and thermally treating the wiring pattern at 150~300° C. in a reducing atmosphere. Even when metal having low electrical conductivity is used, a wiring pattern having high electrical conductivity can be formed. The use of the second metal having a low melting point enables thermal treatment at low temperatures, thus preventing damage to a base layer on which a wiring pattern is formed and preventing a reaction between the metal and the base layer.
申请公布号 US2009029038(A1) 申请公布日期 2009.01.29
申请号 US20080140744 申请日期 2008.06.17
申请人 INDUSTRY-UNIVERSITY COOPERATION FOUNDATION OF SEOKYEONG UNIVERSITY 发明人 HAN KOOK NAM;KIM NAM SOO
分类号 B05D5/12 主分类号 B05D5/12
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