发明名称 Illumination system for microlithographic projection exposure system, has astigmatic refractive optical element astigmatically changing intensity distribution in pupil surface by arrangement on different positions along optical axis
摘要 <p>The system (12) has a field plane exhibiting an angular distribution of light produced by the system. Intensity distribution in a pupil surface is adjustable during an operation for influencing the angular distribution of the light in the field plane. An astigmatic refractive optical element has an optically effective surface consisting of two flat partial surfaces that are bent to each other. The astigmatic refractive optical element astigmatically changes the intensity distribution in the pupil surface by arrangement on different positions along an optical axis. An independent claim is also included for a method for imaging a mask with structures on a light-sensitive layer.</p>
申请公布号 DE102008040181(A1) 申请公布日期 2009.01.29
申请号 DE20081040181 申请日期 2008.07.04
申请人 CARL ZEISS 发明人 BROTSACK, MARKUS;DEGUENTHER, MARKUS
分类号 G03F7/20 主分类号 G03F7/20
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