发明名称 Method for surface modification of semiconductor layer and method of manufacturing semiconductor device
摘要 A method for surface modification of a semiconductor layer and a method of manufacturing a semiconductor device are provided. The method for surface modification of the silicon layer includes following steps. First, a semiconductor layer having several particles on its surface is provided. Next, these particles are removed through a clean process. In the clean process, the semiconductor layer is exposed to an organic matter remover, a first peroxide mixture solution and a second peroxide mixture solution sequentially.
申请公布号 US2009011574(A1) 申请公布日期 2009.01.08
申请号 US20070822076 申请日期 2007.07.02
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 TANG WEI-YAO;WU CHIA-WEI
分类号 H01L21/20;C23G1/02 主分类号 H01L21/20
代理机构 代理人
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