发明名称 POLISHING COMPOSITION, METHOD FOR POLISHING THE SURFACE OF SEMICONDUCTOR INTEGRATED CIRCUIT, AND METHOD FOR PRODUCTION OF COPPER INTERCONNECT FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 <p>The object is to provide a technique for producing a highly flat surface in a semiconductor integrated circuit that utilizes copper as an interconnection metal. Thus, disclosed are: a polishing composition comprising an abrasive grain, an aliphatic carboxylic acid, a pyridinecarboxylic acid, an oxidizing agent and water and having a pH value ranging from 8.2 to 12, wherein the aliphatic carboxylic acid is at least one member selected from the group consisting of a saturated aliphatic monocarboxylic acid having a C12-16 long-chain hydrocarbon group, an unsaturated aliphatic monocarboxylic acid having a C12-22 long-chain hydrocarbon group and an unsaturated aliphatic polycarboxylic acid having a C12-22 long-chain hydrocarbon group; a method for polishing the surface of a semiconductor integrated circuit, which is characterized by polishing a copper film formed on the trench-formed surface by using the polishing composition; and a method for producing a copper interconnect for a semiconductor integrated circuit, which is characterized by forming the copper interconnect by the polishing method.</p>
申请公布号 WO2008155987(A1) 申请公布日期 2008.12.24
申请号 WO2008JP60230 申请日期 2008.06.03
申请人 YOSHIDA, IORI;ASAHI GLASS CO., LTD. 发明人 YOSHIDA, IORI
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
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