DEVICE FOR MEASURING THE THICKNESS OF A LAYER OF MATERIAL

摘要

A device (1; 1b) for measuring the thickness of a layer of material (20) is provided with reading means (2) and control means (3) connected to the reading means (2). The reading means (2) include a microwave planar type sensor (6) and an A/D converter (8) connected to the microwave sensor (6) and arranged in proximity of the microwave sensor (6).