| 摘要 |
A semiconductor test device and a test method are provided to reduce test time of a semiconductor device effectively by carrying out singular semiconductor device test in fault. A semiconductor test device comprises a control signal input part(110), control signal interface unit(120), data Input part(130), test data interface unit(140), test output data interface unit(150), standards data storage module(160) and test comparison unit(170). The control signal input part generates a control signal for test. The control signal interface unit authorizes the control signal in semiconductor devices comprising a semiconductor element(180,190) group for a test. The data Input part generates a test data. The test data interface unit authorizes test data to semiconductor devices comprising a semiconductor element group for a test. The test output data interface unit integrates and receives test output data outputted, at the same time, from the semiconductor devices comprising a semiconductor element group for a test. The standards data storage module stores reference data which are output data when the output of all semiconductor devices comprising a semiconductor element group for a test is excellent. The test comparison unit compares test output data of the test output data interface unit with reference date and determines the fault of the semiconductor element group for a test.
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