发明名称 IMPEDANCE MATCHING APPARATUS
摘要 A dual frequency matching circuit for plasma enhanced semiconductor processing chambers having dual frequency cathodes is provided. The matching circuit includes two matching circuits with variable shunts combined to a common output. The matching circuit balances the load of the independent RF sources to that of the plasma in the processing chamber during operation.
申请公布号 KR20080086556(A) 申请公布日期 2008.09.25
申请号 KR20087022027 申请日期 2004.11.19
申请人 APPLIED MATERIALS INC. 发明人 SHANNON STEVEN C.;HOLLAND JOHN
分类号 H05H1/36;H01J37/32 主分类号 H05H1/36
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