发明名称 APPARATUS AND METHOD FOR HEAT CYCLE TEST
摘要 PROBLEM TO BE SOLVED: To provide a heat cycle test apparatus and a heat cycle test method capable of reporting the accurate life of electronic parts, which require reliability for radio communication, to temperature cycles. SOLUTION: The heat cycle test apparatus for verifying the durability of electronic parts for radio communication to temperature differences is provided with: at least a heating furnace 2; a cooling furnace 3; an electronic part transfer mechanism 5; a transfer controller 6; a temperature sensor 7; a communication characteristic sensor 8; a dryer 10; a dryer 11; and an electromagnetic shielding plate 12. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008224289(A) 申请公布日期 2008.09.25
申请号 JP20070060046 申请日期 2007.03.09
申请人 TOPPAN PRINTING CO LTD 发明人 NAGAI HIDEYUKI
分类号 G01R31/26 主分类号 G01R31/26
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