| 摘要 |
Described are an electronic testing device for memory devices and related methods. The testing device, comprises a memory controller managing a transfer of data and a controller buffer disposed within the memory controller. The controller buffer transfers data between the memory controller and a memory module. The memory controller tests the memory module. The testing device is operable to test the memory module independent of an operating rate of the memory module. The memory controller receives operating data of the memory module.
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