TESTER AND ELECTRONIC DEVICE

摘要

A tester for testing a device under test comprising a section for storing a sequence of main test instructions, a section for storing a sequence of sub-test instructions which are executed in response to execution of a subroutine call instruction included in the sequence of main test instructions, a pattern generating section for reading out instructions sequentially from the sequence of main test instructions, outputting a test pattern corresponding to an executed instruction and timing set information for specifying a timing set in order to output the test pattern, reading out and executing the instructions sequentially from the sequence of sub-test instructions specified by the subroutine call instruction on condition that the subroutine call instruction is executed, and outputting a test pattern corresponding to an executed instruction and the timing set information of a test pattern corresponding to an instruction before the subroutine call instruction in the sequence of main test instructions, and a section for generating a test signal dependent on the test pattern and delivering the test signal to the device under test at a timing specified by the timing set information.