TESTING APPARATUS AND ELECTRONIC DEVICE

摘要

A testing apparatus is provided with a main memory for storing pattern data; a pattern cache memory for caching the pattern data read out from the main memory; a pattern generation control section which reads out the pattern data from the main memory to write it in the pattern cache memory; a pattern generating section which sequentially reads out the pattern data stored in each cache entry of the pattern cache memory and outputs the pattern data; and a channel circuit which generates a test signal for each of a plurality of terminals, based on the pattern data outputted from the pattern generating section and supplies the test signal to a device to be tested. The pattern generation control section is provided with a duplicating section which generates pattern data by duplicating at least one pattern bit of the pattern data as a pattern bit that corresponds to two or more terminals; and a write section which writes the pattern data in the pattern cache memory.