| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a device for measuring a totally reflected terahertz wave, which can be made small in size. <P>SOLUTION: The device 1 for measuring the terahertz wave is constituted so as to acquire the data of a measuring target S by a total reflection measuring method using a terahertz wave and equipped with a light source 1, branch part 12, chopper 13, light path length difference adjusting part 14, polarizer 15, beam splitter 17, terahertz wave generation element 20, internal total reflection prism 31, terahertz wave detection element 40, 1/4 wavelength plate 51, polarizing separation element 52, photodetector 53A, photodetector 53B, differential amplifier 54 and lock-in amplifier 55. The internal total reflection prism 31 is the so-called stigmatic prism and has an incident surface 31a, an emitting surface 31b and a reflecting surface 31c. The terahertz wave generation element 20 is integrally provided to the incident surface 31a of the internal total reflection prism 31, and the terahertz wave detection element 40 is integrally provided to the emitting surface 31b of the internal total reflection prism 31. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
