发明名称 LEVEL DETECTION APPARATUS
摘要 A level detection apparatus includes an illumination slit in which a rectangular first opening which causes illumination light to pass is formed, an optical system configured to illuminate a target object surface by illumination light passing through the illumination slit and focuses reflected light from the target object surface, first and second detection slits which are arranged in front of and in back of a focal point and in each of which a second opening is formed such that a short side of a rectangle is shorter than a short side of a illumination slit image formed by the illumination slit and a long side of the rectangle is larger than a long side of the illumination slit image, first and second light amount sensors configured to detect amounts of light of the reflected lights passing through the first and second detection slits, and a calculating unit configured to calculate a level of the target object surface based on outputs from the first and second light amount sensors.
申请公布号 US2008231846(A1) 申请公布日期 2008.09.25
申请号 US20080031223 申请日期 2008.02.14
申请人 ADVANCED MASK INSPECTION TECHNOLOGY, INC. 发明人 OGAWA RIKI
分类号 G01N21/00;G01B11/02;G02B7/28;G03F1/84 主分类号 G01N21/00
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