| 摘要 |
<p>Provided is a testing apparatus for testing a device to be tested. The testing apparatus is provided with an inclination adjusting section for independently adjusting an inclination of a rising edge and that of a negative-going edge of a measurement target signal outputted from the device; a sampling section for sampling the measurement target signal whose edge inclinations are adjusted by the inclination adjusting section; and a judging section for judging whether the device is conforming or not, based on the sampling results obtained from the sampling section.</p> |
