发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device manufacturing method capable of performing a uniform thermal treatment in a semiconductor layer including impurities without increasing the number of processes and allowing metallic atoms to be excessively diffused into the semiconductor layer, and to provide a semiconductor device. SOLUTION: The method includes: a process for forming the semiconductor layer on a substrate; a process for forming a gate insulating film on the substrate including the semiconductor layer; a process for forming a gate electrode on the gate insulating film; a process for forming an inter-layer insulating film to cover the gate electrode; a process for injecting the impurities to the semiconductor layer with the gate electrode as a mask; a process for depositing an optical absorption film on the inter-layer insulating film; a process for irradiating the optical absorption film with light, and activating the impurities in the semiconductor layer with the heat generated by optical absorption; a process for forming an opening part which penetrates the optical absorption film and the inter-layer insulating film; a process for forming a conductive layer in the optical absorption film, so as to embed the opening; and a process for treating the conductive layer and the optical absorption film to have a pattern shape so as to form a wiring layer. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008226993(A) 申请公布日期 2008.09.25
申请号 JP20070060462 申请日期 2007.03.09
申请人 ADVANCED LCD TECHNOLOGIES DEVELOPMENT CENTER CO LTD 发明人 SASAKI ATSUSHI
分类号 H01L21/336;H01L21/265;H01L21/28;H01L29/786 主分类号 H01L21/336
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