发明名称 Method and apparatus for reducing patterning effects on a substrate during radiation-based heating
摘要 Patterning effects on a substrate are reduced during radiation-based heating by filtering the radiation source or configuring the radiation source to produce radiation having different spectral characteristics. For the filtering, an optical filter may be used to truncate specific wavelengths of the radiation. The different configurations of the radiation source include a combination of one or more continuum radiation sources with one or more discrete spectrum sources, a combination of multiple discrete spectrum sources, or a combination of multiple continuum radiation sources. Furthermore, one or more of the radiation sources may be configured to have a substantially non-normal angle of incidence or polarized to reduce patterning effects on a substrate during radiation-based heating.
申请公布号 EP1944792(A2) 申请公布日期 2008.07.16
申请号 EP20080000487 申请日期 2008.01.11
申请人 APPLIED MATERIALS, INC. 发明人 RAMACHANDRAN, BALASUBRAMANIAN;RANISH, JOSEPH M.;HUNTER, AARON M.
分类号 H01L21/00 主分类号 H01L21/00
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