发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FORMING THEREOF
摘要 A semiconductor device and a forming method thereof are provided to improve current characteristics by growing vertically and uniformly a carbon nano-material. A first interlayer dielectric(110) having a trench is formed on a substrate(100). A lower conductive pattern(120) is provided within the trench. A catalytic metal layer(134) is provided on the lower conductive pattern within the trench. A second interlayer dielectric(140) is formed on the first interlayer dielectric. The second interlayer dielectric includes an opening for exposing the catalytic metal layer. A carbon nano-material is provided in the opening and is grown from the catalytic metal layer. The lower conductive pattern includes copper. A first barrier layer(122) is formed between the lower conductive pattern and the catalytic metal layer in order to prevent the migration of the copper.
申请公布号 KR20080066410(A) 申请公布日期 2008.07.16
申请号 KR20070003836 申请日期 2007.01.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 WON, SEOK JUN;KANG, HO KYU
分类号 H01L21/28 主分类号 H01L21/28
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