| 摘要 |
A semiconductor device is provided in which function modes thereof can be changed without difficulty and failure analysis can be conducted in an apparatus in which the semiconductor device is mounted. A semiconductor device uses a ball grid array package and includes: a semiconductor chip that is provided within the semiconductor device and has a pad; a detection via hole connected to the pad; a solder ball that is attachable to and detachable from the detection via hole and connects or disconnects a power supply electrode of a substrate on which the semiconductor device is mounted and the detection via hole in correspondence to attachment or detachment of the solder ball to or from detection via hole, respectively; and a mode switching unit that detects a voltage level of the pad connected to the detection via hole and switches function modes in the semiconductor device depending on the voltage level.
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