发明名称 METHOD OF ADJUSTING SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPE FOR REALSING SAID METHOD
摘要 FIELD: physics; optics. ^ SUBSTANCE: invention relates to scanning microscopy. The method involves calibration of the scanner and/or positioning the probe based on an interference pattern obtained through additional use of a light source and dividing the stream of light into two coherent streams with pass through different optical paths. The light streams are then converged and directed to the video observation system of the microscope or an additional video observation system. When calibrating the scanner, one of the light streams undergoes reflection from the surface of the sample and/or probe, and when positioning the probe, the light stream undergoes reflection from the surface of the sample. ^ EFFECT: increased information content of scanning, with easier adjustment of the microscope. ^ 7 cl, 11 dwg, 2 ex
申请公布号 RU2382389(C2) 申请公布日期 2010.02.20
申请号 RU20080116296 申请日期 2008.04.28
申请人 OBSHCHESTVO S OGRANICHENNOJ OTVETSTVENNOST'JU NAUCHNO-PROIZVODSTVENNOE PREDPRIJATIE "TSENTR PERSPEKTIVNYKH TEKHNOLOGIJ" 发明人 MEN'SHIKOV EVGENIJ ALEKSANDROVICH;GAVRILKO DMITRIJ JUR'EVICH;RASHKOVICH LEONID NIKOLAEVICH;CHERNOV ALEKSANDR ALEKSANDROVICH;SHUSTIN OLEG ARKAD'EVICH;JAMINSKIJ IGOR' VLADIMIROVICH
分类号 G02B21/00 主分类号 G02B21/00
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